APPLICATION OF X-RAY CT TO CHARACTERIZE THE MICROSTRUCTURESAND DAMAGES IN C/SiC COMPOSITE MATERIAL

doi:10.19936/j.cnki.2096-8000.20210628.011

Abstract

Abstract: The microstructures, damages and damage evolutions in the bulk of C/SiC composite material are characterized by using X-ray CT and three-dimensional digital image processing and analysis method. The advantages of X-ray CT to understand the microstructures and damage mechanisms in C/SiC material are highlighted. The three-dimensional morphologies of carbon fiber bundles, SiC matrix and pores in the bulk of C/SiC composite material and their connectivity are revealed in three-dimension qualitatively. The key three-dimensional geometry parameters, such as the volume, surface area, thickness field for each object, are measured quantificationally, and the variations of pores, carbon fiber bundles and SiC matrix along the direction perpendicular to the laminates could also be obtained. The failure analysis could be performed in the case of undestroying the samples. The final fracture is identified accurately, and the microcracks and the oxidation behaviors under high temperature in the bulk samples are also characterized. The mechanical tests with X-ray CT in-situ observations allow characterizing the damage evolutions in the bulk of C/SiC composite material accurately, and thus help to reveal the damage and failure mechanisms.

Key words: X-ray CT; C/SiC composite material; microstructure; damage; three-dimensional characterization

CLC Number:

TB332

WANG Long, LIU Wu-gang, KONG Fan-jin, ZHANG Yue-ping, YUAN Kai. APPLICATION OF X-RAY CT TO CHARACTERIZE THE MICROSTRUCTURESAND DAMAGES IN C/SiC COMPOSITE MATERIAL[J]. COMPOSITES SCIENCE AND ENGINEERING, 2021, 0(6): 72-76.

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